GradConn Low-Cost Test Probe Cable Assemblies

By News Release | September 15, 2014

The GradConn low-cost test probe cable assemblies are ideal for the inspection of high-frequency circuits.

GradConnGradConn test probes has launched a new range of low-cost coaxial test probe cable assemblies for the inspection of high-frequency circuits.  Suitable for testing Hirose MS-156 and Murata MM8030 subminiature coaxial switch connectors, the new probes offer reliable testing of RF circuits from development through final production. The test probe cable assemblies have a mating test cycle durability of 500 operations for Hirose PCB connectors and 2,000 with Murata.

GradConn’s cable assemblies are perfect for testing high frequency coaxial switches in a manufacturing environment. Standard cable assemblies come with SMA jack connectors for plugging to test equipment; other coaxial interface connectors are available upon request. Customers may specify test probe orientation and cable length to improve ergonomics for operators.

Coaxial switch products are used in applications such as cell phones, smartphones, WLAN/WiMax/UWB, Bluetooth, Zigbee, cordless phones, GPS/DVH-H, microwave measurement equipment, and microwave radio equipment applications.

Cables are fully tested and produced in an ISO 9001:2008 environment.

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