As average sales prices for devices decrease, the cost of testing needs to decrease at the same or greater rate. The PXI platform for semiconductor ATE may be the answer. This is an excerpt from a white paper available from Geotest – Marvin Test Systems. The electronics industry is under constant pressure to lower itsRead More

October 2013 –  In September, John MacWilliams took us through the process of researching, compiling, and writing the iNEMI Roadmap for the electronics industry and gave us a closer look at the findings in the connector section. In this issue, MacWilliams digs deeper into the forecasts for the test & burn-in socket market, highlighting the issues critical to the evolution of these products.

January 15, 2013 – Tektronix educates users on utilizing logic analyzers correctly to acquire digital information from many test points, and then display that information coherently to identify problems.